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SPECTRO XEPOS: Outstanding ED-XRF Analysis Just Got Even Better
Description
The latest generation of
SPECTRO XEPOS spectrometers
represents another quantum leap in energy dispersive
X-ray fluorescence technology
. SPECTRO XEPOS outpaces standard ED-XRF instruments with performance that often matches that of wavelength-dispersive WD-XRF models, at a much lower cost of ownership. Significant upgrades include improved spectra handling for greater screening method accuracy, up to 2X shorter measurement times, and new capabilities for layer analysis.
The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in applications such as petrochemicals, chemicals, environmental and geological samples, ores/concentrates/tailings, clinkers/cements/slags, cosmetics, foods, pharmaceuticals, and more.
Benefits of the SPECTRO XEPOS ED-XRF include:
Improved screening accuracy based on new spectra handling approaches
Faster measurements, up to a factor of 2 for dedicated applications
Multilayer analysis, up to 8 layers, up to 55 elements
In this webinar, SPECTRO's XRF Product Manager, Dirk Wissmann, presents the capabilities and key features of the new analyzer.
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SPECTRO XEPOS: Outstanding ED-XRF Analysis Just Got Even Better
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